Buy Mil Spares is your sourcing solution for top-quality military and defense parts, aerospace parts, and other similar products that are necessary for operational fulfillment. You have reached the RFQ page for part number SN5420F-883B, a Microcircuit Digital item that is listed with the NSN 5962-01-009-1470 for an ease of identification. Manufactured by National Semiconductor Corporation and readily available for procurement today, you are always welcome to request a quote on this NSN part to receive tailored pricing information and fulfillment options from our team. Simply offer us important information like your desired quantity, price, and fulfillment timeframe, and our team will supply you with a tailored quote on part number SN5420F-883B in 15 minutes or less.
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To ensure that customers quickly identify and procure exact items, we list everything with as much relevant information as possible. For example, while part number SN5420F-883B is manufactured by National Semiconductor Corporation, it is specifically done so under CAGE Code 27014, a unique identifier assigned to a specific facility by the DLA that supplies to various government or defense agencies. Furthermore, using the first digits of the NSN 5962-01-009-1470, one can also determine that this part falls under FSC 5962 Microcircuits Electronic. With this in mind, continue exploring our website today, and see how we can help you secure competitive pricing and rapid lead times on all desired NSN parts.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-009-1470 Item Description: MICROCIRCUIT,DIGITAL | 5962 | 010091470 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | U | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
SN5420F/883B | 3 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
CBBL | Features Provided | BURN IN AND |
AFJQ | Storage Temp Range | -65.0 TO 150.0 DEG CELSIUS |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CQZP | Input Circuit Pattern | DUAL 4 INPUT |
ADAT | Body Width | 0.270 INCHES MAXIMUM |
CQSJ | Inclosure Material | CERAMIC |
CSSL | Design Function And Quantity | 2 GATE, NAND |
CBBL | Features Provided | HERMETICALLY SEALED AND |
CBBL | Features Provided | POSITIVE OUTPUTS |
ADAQ | Body Length | 0.385 INCHES MAXIMUM |
CQSZ | Inclosure Configuration | FLAT PACK |
MRC | Decoded Requirement | Clear Text Reply |
AEHX | Maximum Power Dissipation Rating | 80.0 MILLIWATTS |
ADAU | Body Height | 0.080 INCHES MAXIMUM |
CBBL | Features Provided | MONOLITHIC AND |
AFGA | Operating Temp Range | -55.0 TO 125.0 DEG CELSIUS |
CZEQ | Time Rating Per Chacteristic | 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND |
CZEQ | Time Rating Per Chacteristic | 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
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