Buy Mil Spares is your sourcing solution for top-quality military and defense parts, aerospace parts, and other similar products that are necessary for operational fulfillment. You have reached the RFQ page for part number 116475, a Microcircuit Memory item that is listed with the NSN 5962-01-449-0676 for an ease of identification. Manufactured by Datametrics Corporation and readily available for procurement today, you are always welcome to request a quote on this NSN part to receive tailored pricing information and fulfillment options from our team. Simply offer us important information like your desired quantity, price, and fulfillment timeframe, and our team will supply you with a tailored quote on part number 116475 in 15 minutes or less.
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To ensure that customers quickly identify and procure exact items, we list everything with as much relevant information as possible. For example, while part number 116475 is manufactured by Datametrics Corporation, it is specifically done so under CAGE Code 19059, a unique identifier assigned to a specific facility by the DLA that supplies to various government or defense agencies. Furthermore, using the first digits of the NSN 5962-01-449-0676, one can also determine that this part falls under FSC 5962 Microcircuits Electronic. With this in mind, continue exploring our website today, and see how we can help you secure competitive pricing and rapid lead times on all desired NSN parts.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-449-0676 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 014490676 | 0 | N | D | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | D | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
8200902JA | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
CBBL | Features Provided | BIPOLAR AND BURN IN AND 3-STATE OUTPUT AND MONOLITHIC |
AEHX | Maximum Power Dissipation Rating | 1.04 WATTS |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CQSJ | Inclosure Material | CERAMIC |
MRC | Decoded Requirement | Clear Text Reply |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
TTQY | Terminal Type And Quantity | 24 PRINTED CIRCUIT |
CWSG | Terminal Surface Treatment | SOLDER |
AGAV | End Item Identification | TERMINAL, RADIO COMMUNICATIONS SETS (MILSTAR) AN/FRC-181 (V) AND AN/ARC-208 (V) |
CZEQ | Time Rating Per Chacteristic | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL INPUT |
CZER | Memory Device Type | PAL |
CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
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