Buy Mil Spares is your sourcing solution for top-quality military and defense parts, aerospace parts, and other similar products that are necessary for operational fulfillment. You have reached the RFQ page for part number B504OPTION500, a Test Program Set item that is listed with the NSN 6625-01-476-1772 for an ease of identification. Manufactured by Advanced Testing Technologies and readily available for procurement today, you are always welcome to request a quote on this NSN part to receive tailored pricing information and fulfillment options from our team. Simply offer us important information like your desired quantity, price, and fulfillment timeframe, and our team will supply you with a tailored quote on part number B504OPTION500 in 15 minutes or less.
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To ensure that customers quickly identify and procure exact items, we list everything with as much relevant information as possible. For example, while part number B504OPTION500 is manufactured by Advanced Testing Technologies, it is specifically done so under CAGE Code 0DRX9, a unique identifier assigned to a specific facility by the DLA that supplies to various government or defense agencies. Furthermore, using the first digits of the NSN 6625-01-476-1772, one can also determine that this part falls under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. With this in mind, continue exploring our website today, and see how we can help you secure competitive pricing and rapid lead times on all desired NSN parts.
| MRC | Criteria | Characteristic |
|---|---|---|
| MRC | Decoded Requirement | Clear Text Reply |
| CXCY | Part Name Assigned By Controlling Agency | OPTION 504 HIGH DIGITAL TEST SYSTEM |
| FEAT | Special Features | SAME AS THE BRAT B504 50 MHZ HIGHSPEED DIGITAL TEST SYSTEM; CAN BE USEDIN A VARIETY OF BRAT TEST STATION; RECONFIGURABLE WITH ROOM FOR EXPANSION; THE INTERFACE, 320/640 HIGH SPEED DIGITAL INPUT/OUTPUT PINS; HAS ANALOG TEST POINTS; MULTIPLE PROGRAMMABLE AC AND DC POWER SYSTEMS ARE RECONFIGURABLE PRECISION POWER SUBSYSTEMS; HIGH SPEED DYNAMIC DIGITAL; SEVEN DISTINCT I/O MEMORY TYPES DATA FORMATTING W/ PRECIES EDGE PLACEMENT; INTENED FOR USE IN AN AUTOMATIC TESTING ENVIRONMENT THAT REQUIRES HIGH SPEED DIGITAL STIMULUS AND RESPONSE CAPABILITIES FOR SERIAL AND PARALLEL TESTING; THIS BRAT SYSTEM IS IN AN MS-WINDOWS ENVIRONMENT; OPTION 500 ADDS INCREASED PIN COUNT FROM 640 TO 800+ TO ACCOMMODATE THE AMP (728I/O) AND THE VIM (637 I/O) |
| AJKE | End Item Source | 0DRX9 |
| AGAV | End Item Identification | USED WITH BRAT TEST STATIONS |
| AFJS | Portability Method | BRAKE TYPE CASTERS |
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