For all the NSN 6625-00-179-5844 parts you are seeking, turn to our vast collection of offerings here on Buy Mil Spares. On this page, part numbers like 902-470, ANUSM206A, and others with the NSN 6625-00-179-5844 are featured alongside applicable listing information for your ease of perusal. If any specific item grabs your attention within our NSN 6625-00-179-5844 inventory, you can use the “RFQ” button to its right to access one of our online quote request forms. Once we have an opportunity to receive and assess the details you provided, you can anticipate a tailored response in 15 minutes or less.
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Item Name | Test Set Semiconduc |
Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
National Item Identification Number (NIIN) | 00-179-5844 (001795844) |
NCB Code | USA (00) |
Manufacturer | Hickok Incorporated, Joint Electronics Type Designation System |
Part Number | Manufacturer | Item Name | Cage Code | RFQ |
---|---|---|---|---|
902-470 | hickok incorporated | test set semiconduc | 28569 | RFQ |
ANUSM206A | hickok incorporated | test set semiconduc | 28569 | RFQ |
902-470 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
ANUSM206A | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
FAAZ | PHASE | SINGLE |
AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
ABRY | LENGTH | 9.000 INCHES NOMINAL |
ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
HGTH | HEIGHT | 10.000 INCHES NOMINAL |
AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
ABGL | WIDTH | 8.000 INCHES NOMINAL |
Relevant Components for NSN - 6625-00-179-5844, 6625001795844 | ||||
6695-01-375-4984 (6695013754984) | 6625-00-585-5946 (6625005855946) | 6625-01-163-4082 (6625011634082) | 6685-00-479-3485 (6685004793485) | |
6680-00-240-3143 (6680002403143) | 6680-01-370-6784 (6680013706784) | 6680-00-302-5926 (6680003025926) | 6685-00-233-6563 (6685002336563) | |
6635-01-457-9442 (6635014579442) | 6650-01-369-5432 (6650013695432) | 6685-01-131-3986 (6685011313986) | 6625-00-710-2757 (6625007102757) | |
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