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Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-151-4347 (011514347) |
NCB Code | USA (01) |
Manufacturer | Raytheon Company |
MRC | Criteria | Characteristic |
---|---|---|
ADAT | BODY WIDTH | 0.310 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.840 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.185 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |
CZER | MEMORY DEVICE TYPE | ROM |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
TTQY | TERMINAL TYPE AND QUANTITY | 16 PRINTED CIRCUIT |
CRHL | (NON-CORE DATA) BIT QUANTITY | 1024 |
CSWJ | (NON-CORE DATA) WORD QUANTITY | 256 |
AEHX | MAXIMUM POWER DISSIPATION RATING | 715.0 MILLIWATTS |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CBBL | FEATURES PROVIDED | MONOLITHIC AND PROGRAMMABLE AND BURN IN |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.5 VOLTS MAXIMUM POWER SOURCE |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-2 MIL-M-38510 |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
Relevant Components for NSN - 5962-01-151-4347, 5962011514347 | ||||
5962-01-043-4709 (5962010434709) | 5910-00-061-7075 (5910000617075) | 5945-00-904-4864 (5945009044864) | 5915-01-056-0859 (5915010560859) | |
5995-01-204-7361 (5995012047361) | 5935-01-185-4152 (5935011854152) | 5962-01-196-4660 (5962011964660) | 5910-00-828-8915 (5910008288915) | |
5935-01-582-3602 (5935015823602) | 5925-00-792-3904 (5925007923904) | 5960-00-275-7497 (5960002757497) | 5935-00-954-9081 (5935009549081) | |
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